New higher resolution LVEM5 with 'TEM BOOST - Enhanced Imaging Module' to be introduced at MRS Fall Meeting

Delong America is proud to announce the release of new model LVEM5 benchtop electron microscope with TEM BOOST - Enhanced Imaging Module.


TEM BOOST – enhanced imaging module

TEM BOOST is a hardware-based enhancement of TEM imaging mode on the LVEM5 electron microscope that provides increased total magnification and higher resolving power in the TEM images.

Enhanced image quality throughout the entire TEM magnification range, coupled with a much wider range of magnifications makes this optional upgrade a significant improvement over the already powerful base model LVEM5.

The magnification range is improved to 1,400-700,000 times. Combined with an improved resolving power of 1.2 nm, this yields a TEM image resolution of 0.2nm/pixel at maximum magnification.

For nanoparticle analysis this means significantly improved size and shape measurements of objects in the 2-10nm range. For thin sections this means larger field of view and enhanced image quality throughout the full range of magnifications. Many other application areas will benefit from this improvement.

For more details please visit the refreshed LVEM5 Benchtop TEM website


LVEM5 Benchtop Electron Microscope

The LVEM5 is the next generation of electron microscope, built on a revolutionary technology platform that combines advanced imaging with unparalleled benchtop convenience. The LVEM5 is the smallest multi-mode desktop electron microscope on the market today. 

The clever build of the LVEM5 is its compact, truly desktop design. It can accommodate up to 4 imagining modes (TEM, STEM, SEM, and electron diffraction) and allows for effortless transitioning between modes. The operations of the LVEM5 are straightforward, and routine procedures such as column alignment don't require unreasonable effort and time. Downtime is further minimized by quick sample exchange. 

For more details please visit the refreshed LVEM5 Website and feel free to send us any comments to  This e-mail address is being protected from spambots. You need JavaScript enabled to view it

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