LVEM5 benchtop electron microscope on display at Pittcon 2011 (Booth 4082)

Delong America is pleased to announce that for the first time ever we will have the LVEM5 benchtop electron microscope on display at the Pittcon Conference and Expo in Atlanta Georgia. We will be pleased to meet with you at our booth number 4082. The exhibits will be open March 14th to 17th.

The LVEM5 is the only multi-modal desktop EM on the market. It is able to operate in transmission modes as a TEM and in scanning modes as a SEM or STEM. Users are able to obtain all three types of information from the same sample and even the same area of interest. The LVEM5 is also capable of preforming electron diffraction.

The LVEM5 is capable of 2nm resolution in TEM mode and 3nm resolution in SEM mode, so you can see even your smallest of particles

The LVEM5 benefits from a 5kv electron source that means that you can visualize light weight materials such as polymers or biological tissues without the need for heavy metal stains. This is a huge advantage for users who want to get a greater understanding of their materials, and not their stain.

Please feel free to come by and schedule a demo to see this unique instrument for yourself. We are looking forward to meeting with you at the conference.


The LVEM5 Team

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