Delong America is pleased to announce that we will have the LVEM5 benchtop electron microscope on display at booth 706 at the Materials Research Society (MRS) fall 2012 meeting in Boston, Massachusetts. The exhibits will be open November 27th until the 29th. We look forward to announcing some exciting new LVEM5 developments at the meeting.
This year we are proud to announce we will be sponsoring a special symposium
Program - Symposium YY: Low-Voltage Electron Microscopy and Spectroscopy for Materials Characterization
- LawrenceÂ F.Â Drummy, Air Force Research Laboratory
- UteÂ A.Â Kaiser, University of Ulm
- DavidÂ Joy, "University of Tennessee"
The LVEM5 is capable of 2nm resolution in TEM mode and 3nm resolution in SEM mode, so you can see even your smallest of particles
The LVEM5 benefits from a 5kv electron source that means that you can visualize light weight materials such as polymers or biological tissues without the need for heavy metal stains. This is a huge advantage for users who want to get a greater understanding of their materials, and not their stain.
Please feel free to come by and schedule a demo to see this unique instrument for yourself. We are looking forward to meeting with you at the conference.
The LVEM5 Team