Delong America is pleased to announce that we will be at booths 67-69 at the 18th International Microscopy Congress in Prague, Czech Republic. The exhibits will be open June 8-11.
The International Microscopy Congressis the the biggest international platform for sharing knowledge, exchange of views and experience, and discussion on all aspects of microscopy. Delong will have some exciting news to share at this conference, so please make sure to come by and see what's new.
The LVEM5 is the only multi-modal desktop EM on the market. It is able to operate in transmission modes as a TEM and in scanning modes as a SEM or STEM. Users are able to obtain all three types of information from the same sample and even the same area of interest. The LVEM5 is also capable of preforming electron diffraction.
The LVEM5 is capable of 1.2nm resolution in TEM mode and 3nm resolution in SEM mode, so you can see even your smallest of particles.
The LVEM5 benefits from a 5kv electron source that means that you can visualize light weight materials such as polymers or biological tissues without the need for heavy metal stains. This is a huge advantage for users who want to get a greater understanding of their materials, and not their stain.
We are looking forward to meeting with you at the conference.