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The
technology behind the LVEM5 enables the power of nanometer electron
imaging – both ultra structural detail (TEM) and surface detail (SEM) –
to be delivered in a very small footprint.
Furthermore, the low 5 kV
accelerating voltage permits the unique advantage of ultra high
contrasted results.
Accomplishing these
technological innovations required a focused objective of completely
redefining how the electron microscope would appear and act. Many years
of development and design were invested to achieve the result we are
able to deliver to the user today. The LVEM5 encompasses a completely
new approach to electron optics. Employing small uncooled lenses
eliminates the need for cooling water and significant size of the
device while the FEG has been designed to deliver a bright cohesive
beam that detects subtle contrast differences undetectable by
conventional TEM without staining.
The implementation of a
small YAG screen as the scintillator further reduces the size and
complexity of the microscope. The optical image that forms on the YAG
screen is small but well big enough to be captured by classical light
objectives which are smaller and much more stable than electron optical
lenses used in conventional TEM.
Adding a BSED (Back
Scattered Electron Detector) into the column enables SEM imaging of the
same sample and the same ROI (Region if Interest) within the sample in
both transmission and scanning modes. The operator can effortlessly
switch between these modes – right from the software interface –and no
re-alignment is required between observation in TEM and SEM modes.
All in all the LVEM5
represents a new era in nanometer scale electron microscopy
characterized by accessibility, versatility and convenience.
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