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The technology behind the LVEM5
enables the power of nanometer
electron imaging – both ultra
structural detail (TEM) and surface
detail (SEM) – to be delivered in a
very small footprint.
Furthermore, the
low 5 kV accelerating voltage
permits the unique advantage of
ultra high contrasted results.
Accomplishing these technological
innovations required a focused
objective of completely redefining
how the electron microscope would
appear and act. Many years of
development and design were invested
to achieve the result we are able to
deliver to the user today. The LVEM5
encompasses a completely new
approach to electron optics.
Employing small uncooled lenses
eliminates the need for cooling
water and significant size of the
device while the FEG has been
designed to deliver a bright
cohesive beam that detects subtle
contrast differences undetectable by
conventional TEM without staining.
The implementation of a small YAG
screen as the scintillator further
reduces the size and complexity of
the microscope. The optical image
that forms on the YAG screen is
small but well big enough to be
captured by classical light
objectives which are smaller and
much more stable than electron
optical lenses used in conventional
TEM.
Adding a BSED (Back Scattered
Electron Detector) into the column
enables SEM imaging of the same
sample and the same ROI (Region if
Interest) within the sample in both
transmission and scanning modes. The
operator can effortlessly switch
between these modes – right from the
software interface –and no
re-alignment is required between
observation in TEM and SEM modes.
All in all the LVEM5 represents a
new era in nanometer scale electron
microscopy characterized by
accessibility, versatility and
convenience.
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