The LVEM5 transmission electron microscope mode can be used in combination with the optional tilt holder to perform Electron Tomography. This is a technique for obtaining detailed 3D structures from 2D images. In the process, a beam of electrons is passed through the sample at incremental degrees of rotation around the center of the target sample. This information is collected and used to assemble a three dimensional image of the target.
Additionally, the LVEM5 scanning electron microscope mode can be used in combination with the optional tilt holder to perform photogrammetry. This technique involves extraction of 3D geometry information from 2D images taken from a sample held at different angles relative to the BSE detectors.
The Tilt Holder for the LVEM5 allows analysis of various different sample types from different points of view, thus enabling reconstruction of a 3D image of the sample.
The LVEM5 is the next generation of electron microscopes, built on a revolutionary technology platform that combines advanced imaging with unparalleled benchtop convenience.
|±22.5º of tilt|
|Compatible with TEM, SEM and STEM modes|