STEM Scanning Transmission Electron Microscope

STEM imaging differs from TEM in that, as opposed to the entire specimen area being simultaneously flooded by the electron beam, the beam is finely focused to a narrow probe and scans across the specimen. This technique is useful when viewing particularly thick and stained samples.

Key Specifications
Operation Voltage 10, 15kV
Resolution: 10kV
15kV
1.0 nm
1.3 nm
Max magnification: 10kV
15kV
375,000x
470,000x
Image Capture size 512x512, 1024x1024, 2056x2056
Electron Source Field Emission Gun (FEG)
Motorized stage Standard (x, y, z axis)
LVEM25 Product Tour Image

The LVEM25 is the newest and most powerful benchtop Low Voltage Electron Microscope built on an enhanced technology platform and designed to work with conventionally prepared materials.