STEM Scanning Transmission Electron Microscope
STEM imaging differs from TEM in that, as opposed to the entire specimen area being simultaneously flooded by the electron beam, the beam is finely focused to a narrow probe and scans across the specimen. This technique is useful when viewing particularly thick and stained samples.
|Operation Voltage||10, 15kV|
|Max magnification: 10kV
|Image Capture size||512x512, 1024x1024, 2056x2056|
|Electron Source||Field Emission Gun (FEG)|
|Motorized stage||Standard (x, y, z axis)|