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TEM involves the penetration of the electron beam through thin sample sections.
It is this mode that the enhanced native contrast advantage is most pronounced. In all EM, TEM information is obtained as the electron beam travels through, and exchanges energy with the sample. The LVEM5 electron beam has accelerating voltages well below those of traditional EM and this leads to increased electron scattering which in turn leads to greater contrast.
With ultra-high contrast, and the fact that the LVEM electrons are formed into a bright and coherent beam, notable improvements are observed in the quality of the TEM results.
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