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Upcoming events:
November 30 - December
2nd, 2010
2010
MRS
Fall
Meeting,
Boston, MA (Booth 222)
click
here
for
more info
Past
Events:
September 1-3, 2010
JAIMA
EXPO 2010
Makuhari
Messe International Exhibition Hall - Chiba City, Japan
August 2-5, 2010
Microscopy
and
Microanalysis
2010
Oregon Convention Center - Portland, OR
June 27 - July 2, 2010
11th
International
Conference on the Science and Application of Nanotubes
Hilton Bonaventure - Montréal, Canada
June 16 - 18, 2010
Central
Regional Meeting of the American
Chemical Society 2010
Dayton
Convention Center - Dayton, OH
December 1- 3, 2009
MRS
Fall Meeting -
Hynes Convention Center - Boston, MA (Booth 909)
October 19, 2009
NanoBiotech
2009
-
Rensselaer
Polytechnic Institute, Troy, NY
November 29 - 30, 2007
2007
MRS
Fall
Meeting,
Boston, MA
Delong will
exhibit its full version (TEM, SEM, STEM, electron diffraction) LVEM5
benchtop Electron Microscope at the 2007 MRS Fall Meeting in Boston.
The meeting will feature 42 technical symposia in seven topical
clusters, an international exhibit highlighting products and services
of interest to the materials community, and much more.
April 23-26, 2007
Nano Materials for
Defense Applications, San Diego, CA
Delong will
exhibit its full version (TEM, SEM, STEM, electron diffraction) LVEM5
benchtop Electron Microscope at the 5th annual NanoMaterials for
Defense Applications Symposium. The meeting, under the theme of
“Accelerating the Transition” will focus on transitioning material
innovations enabled by control of the nanostructure (nanomaterials) to
beneficial application for military and dual-use technologies. The
meeting will bring together technical representatives from industry,
university, and government
December 2006
MRS Fall 2006 Meeting,
Boston, MA
The new
version of the Delong benchtop electron microscope, the LVEM5, was on
display at the MRS show here in Boston. The system – with a newly
improved control console and user interface, was well received and
showed why it has such a strong “wow” factor. Due to its small size,
ease of use and limited affects of vibration, participants were witness
to the system in full operation. Images were acquired on the spot in
both TEM and SEM modes and some visitors experienced the easy
operations hands-on.
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