Delong America Blog

LVEM5 Benchtop Electron Microscope – Nanoscale from your Benchtop

Browsing Posts in News

Delong America is pleased to announce that we will have the LVEM5 benchtop electron microscope on display  at booth 553 at  the Microscopy and Microanalysis 2010 conference in the beautiful city of Portland, Oregon.

The LVEM5 is the only multi-modal desktop EM on the market. It is able to operate  in transmission modes as a TEM and in scanning modes as a SEM or STEM. Users are able to obtain all three types of information from the same sample and even the same area of interest. The LVEM5 is also capable of preforming electron diffraction.

The LVEM5 is capable of 2nm resolution in TEM mode and 3nm resolution in SEM mode, so you can see even your smallest of particles

The LVEM5 benefits from a 5kv electron source that means that you can visualize light weight materials such as polymers or biological tissues without the need for heavy metal stains. This is a huge advantage for users who want to get a greater understanding of their materials, and not their stain.

Please feel free to come by and schedule a demo to see this unique instrument for yourself. We are looking forward to meeting with you at the conference.

Regards,
The LVEM5 Team



Posted from Montreal, Quebec, Canada.

Undergraduate biology students at Lehigh University are using the LVEM5 to evaluate bacteriophages obtained from local soil samples.  Starting with a tube of dirt collected from a location of their choice, each student underwent the process of isolating and purifying their bacteriophages from plaques on bacterial lawns.  Plaques were selected and purified by repeated plating and observation.

(more detail and selected images below)

continue reading…

There is a rather informative entry on Wikipedia  (Click Here) detailing the Low Voltage Electron Microscopy (LVEM) technique. The entry goes through the advantages and limitations of the technique. The most notable advantages of  LVEM are increased contrast, the  elimination of the heavy metal staining procedure, and the ability to have TEM, SEM and STEM in the same instrument. We are proud to say that the LVEM5 is currently the only Low Voltage Electron Microscope available commercially today.

continue reading…

Welcome to the Delong America Blog where you will find the most up to date information about the LVEM5 benchtop electron microscope. Here we will post exciting new applications for the LVEM5 as well as stories from users. We will also post updates to our website.

Posted from Montreal, Quebec, Canada.

Delong America marks with sadness the death of James Hillier, a pioneer in the field of electron optics.

Dr. Hillier was instrumental in designing electron microscopes for practical use by the scientific community – and was an advocate in the early years for its adoption.

We mourn his passing as we salute his accomplishments and recognize that were it not for his work our industry would be far from where it is today.

For more information on Dr. Hillier, please visit the website of The James Hillier Foundation at http://comdir.bfree.on.ca/hillier/index.html.

Delong Instruments is proud to introduce the new LVEM5. The new version has significant improvements in system design and user controls, operating software and the introduction of a new 2K by 2K digital CCD camera.

Powered by WordPress Web Design by SRS Solutions © 2010 Delong America Blog Design by SRS Solutions