Delong Instruments is proud to introduce the new LVEM5. The new version has significant improvements in system design and user controls, operating software and the introduction of a new 2K by 2K digital CCD camera.
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A new version LVEM5 was installed in the Chemical Engineering Department at Howard University. Dr. James Mitchell’s research demanded that an electron microscope be installed in a clean room where his research would include materials characterization using both SEM and TEM modes. The small benchtop footprint of the LVEM5 provided the TEM and SEM functionality at a fraction of the space that a conventional SEM or TEM would require. For more information on this please click here
At NIST, the LVEM5 will be used in the Polymers Division to image a broad variety of materials in TEM and scanning modes.
At the University of Tennessee the LVEM5 will be used in the Chemistry department to image materials of various compositions in both TEM and SEM mode.
The LVEM5 was installed in Professor David Bucknall’s lab. Professor Bucknall’s area of specialization is in polymers and will use the LVEM5 for imaging in both TEM and SEM modes.
The LVEM5 was installed at the Scripps Research Institute for evaluation as a biotech tool for screening membrane protein solutions.
The first LVEM5 to be installed in the US was placed in the Air Force Research Laboratory at Wright Patterson Air Force Base. The system – with TEM, STEM and SEM capabilities – will be used to image a broad variety of polymer and other material samples.
