Delong America Blog

LVEM5 Benchtop Electron Microscope – Nanoscale from your Benchtop

Browsing Posts published in May, 2006

Delong Instruments is proud to introduce the new LVEM5. The new version has significant improvements in system design and user controls, operating software and the introduction of a new 2K by 2K digital CCD camera.

A new version LVEM5 was installed in the Chemical Engineering Department at Howard University. Dr. James Mitchell’s research demanded that an electron microscope be installed in a clean room where his research would include materials characterization using both SEM and TEM modes. The small benchtop footprint of the LVEM5 provided the TEM and SEM functionality [...]