TEM Transmission Electron Microscope

Transmission electron microscope (TEM) involves the penetration of the electron beam through thin sample sections.


It is in this mode that the enhanced native contrast advantage of the LVEM5 is most pronounced. In transmission electron microscopy information is obtained as the electrons of the incident beam travels through, and are scattered by the atoms of the sample. Typical Samples for TEM analysis are ultra-thin sections of bulk materials, or nano-sized particles or filaments deposited onto a thin film.


The LVEM5 is the only low voltage (5kV) Transmission electron microscope. This is well below typical accelerating voltage of traditional EM (80-200kV), resulting in increased electron scattering which in turn leads to greater contrast in the TEM image.


Benefits of improved contrast

  • Improved contrast - Lower threshold for density differences
  • Visualize samples that cannot be resolved by high kV methods without the use of heavy metal stains
  • Avoid artifacts : non-existing structures brought about by stains
LVEM5 Product Tour

The LVEM5 is the next generation of electron microscopes, built on a revolutionary technology platform that combines advanced imaging with unparalleled benchtop convenience.



Key Application areas
Nanoparticle characterization
Coatings
Biology
Polymer Sciences
 
Figure 1
Isolated flagella of Borrelia burgdorferi without an addition of contrasting agents in 5 kV TEM.

Figure 2
Flagella negatively stained with uranyl acetate in 100 kV TEM.
TEM improved contrast
Courtesy of:
Institute of Parasitology, Academy of Sciences of the Czech Republic
Microsc Microanal 13 (Suppl 3), 2007

Due to ultra-high contrast, and image generation brought by a bright and highly coherent electron beam, notable improvements are observed in the quality of the TEM results. In particular, samples that would normally need to be prepared with contrast improving stains would be able to forgo this step for imaging on the LVEM5.


The LVEM5 is the only transmission electron microscope available in a benchtop configuration. The LVEM5’s miniature size means that it can be installed in your workspace, right where you need it. The LVEM5 does not require a dedicated facility for installation. No special power or cooling requirements are needed and vibration isolation is generally not a concern.


 

TEM BOOST - Enhanced Imaging Modulesomething-new

TEM BOOST is a hardware-based enhancement of the TEM imaging mode that provides increased total magnification and higher resolving power in the TEM images. A more advanced and powerful projective lens, combined with a far more sensitive camera allows for higher image quality as well as higher magnificationa and resolution.

The magnification range is improved to 1,400-700,000 times. Combined with an improved resolving power of 1.2nm, this improves TEM final image resolution to 0.18nm/pixel at maximum magnification. (compared to 0.65nm/pixel on the base unit)


For more information see the TEM BOOST Page
 
 



Key Specifications
Operation Voltage 5kV
Resolution:
           Base Model
           With TEM BOOST  

2 nm
1.2 nm
Final Image Resolution: Base Model
           With TEM BOOST 

0.65 nm/pixel
0.18nm/pixel
Magnification Range:
           Base Model
           With TEM BOOST

2,200x - 230,000x
1,400x - 700,000x
Max Image Capture size:
          Base Model
           With TEM BOOST

2056x2056
2560x2160
Electron Source Field Emission Gun (FEG)
Motorized stage  Yes