STEM Scanning Transmission Electron Microscope

STEM imaging differs from TEM in that, as opposed to the entire specimen being simultaneously illuminated by the electron beam, the beam is reduced to a much smaller diameter and scans across the specimen. This technique is useful when viewing stained samples or when the samples are thicker than that required by TEM.

LVEM5 Product Tour

The LVEM5 is the next generation of electron microscopes, built on a revolutionary technology platform that combines advanced imaging with unparalleled benchtop convenience.