SEM Scanning Electron Microscope
In Scanning Electron Microscope (SEM) mode, the beam never transmits through the sample. Instead, the beam is scanned back and forth over the sample. Electrons that rebound off the sample are collected by a special back scattered electron detector (BSE) and an image of the surface structure and compositional information is created. The BSE detector is broken down into quadrants, offering multiple view angles of the object. With SEM imaging most any sample can be observed, regardless of staining or section thickness.
Practically any solid sample can be observed in SEM mode, with minimal prior preparation. While coating is often required for SEM imaging of non-conductive materials, the low accelerating voltage of the LVEM5 allows observation of many non-conductive samples in their native state, without coating. Typical samples for SEM observation are sections or fracture surfaces of bulk specimens, as well as nanoparticles or filaments distributed on a substrate.
The LVEM5 is the only multi-modal electron microscope available in a benchtop configuration. It is the only benchtop SEM with the ability to also image in TEM and STEM modes.
The LVEM5 is so remarkably simple that anyone can use it. No longer will you need highly trained technicians to take electron micrographs. The controls are intuitively configured on an ergonomically designed remote control panel that can be positioned as required. Feedback is provided directly on the control panel as well as through the LVME5’s comprehensive software.
The LVEM5 is the next generation of electron microscopes, built on a revolutionary technology platform that combines advanced imaging with unparalleled benchtop convenience.
|Magnification Range||640x - 100,000x|
|Image Capture Size||512x512, 1024x1024, 2056x2056|
|Electron Source||Field Emission Gun (FEG)|